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SciCrunch Registry is a curated repository of scientific resources, with a focus on biomedical resources, including tools, databases, and core facilities - visit SciCrunch to register your resource.

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Resource Name Proper Citation Abbreviations Resource Type Description Keywords Resource Relationships Related Condition Funding Defining Citation Availability Specification URL Alternate IDs Alternate URLs Old URLs Parent Organization Resource ID Synonyms Record Last Update Mentions Count
Fluidigm: Helios Cell Mass Cytometer
 
Resource Report
Resource Website
1+ mentions
Fluidigm: Helios Cell Mass Cytometer (RRID:SCR_019917) instrument resource Helios, a CyTOF system, comprises the most recent advances in mass cytometry and is designed to provide a new and improved tool for bioanalytical single-cell detection and analysis. This high-performance mass cytometer, from the CyTOF family of instruments, enables the analysis of more than 40 markers and ly allows their quantitative determination with negligible spectral overlap, a result of exquisite resolution between mass detection channels. Helios provides users with 135 detection channels that can simultaneously resolve multiple elemental probes at high acquisition rates, thereby maximizing the per-cell information obtained from a single sample. The expanded mass range of 75 209 amu and superior mass resolution provide researchers with the ability to differentiate adjacent peaks. The Helios system provides fast instrument startup, an easyto-use pneumatic sample loading system, an improved cell detection rate, and enhanced data storage capabilities. These attributes provide researchers with an unparalleled ability to generate high-resolution phenotypic and functional profiles of cells from normal and diseased states Fluidigm, Cell Mass Cytometer, Instrument Equipment, USEDit Commercially available https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019917.pdf Model_Number_Helios SCR_019917 2026-09-19 12:54:21 2
FEI: Meridian 7 System for Semiconductors
 
Resource Report
Resource Website
FEI: Meridian 7 System for Semiconductors (RRID:SCR_019888) instrument resource Electrical failure analysis system for semiconductors that provides visible laser voltage imaging and probing and dynamic laser stimulation on sub-10nm devices. FEI, EFA System, Instrument Equipment, USEDit, Commercially available Model_Number_Meridian_7 SCR_019888 2026-09-19 12:54:20 0
Thermo Fisher: Forma Steri-Cycle CO2 Incubators
 
Resource Report
Resource Website
1+ mentions
Thermo Fisher: Forma Steri-Cycle CO2 Incubators (RRID:SCR_019921) instrument resource Incubator that features an in-chamber HEPA air filtration system, which provides continuous protection against unwanted airborne contaminants, along with an on-demand, high-temperature sterilization cycle that simplifies routine cleaning. Thermo Fisher, Thermo Fisher, Incubator, Instrument, Equipment, USEDit, Commercially available https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019921.pdf Model_Number_Steri-Cycle SCR_019921 2026-09-19 12:54:21 2
Gatan: BioContinuum Imaging Filter Transmission Electron Microscope (TEM) Imaging and Spectroscopy
 
Resource Report
Resource Website
1+ mentions
Gatan: BioContinuum Imaging Filter Transmission Electron Microscope (TEM) Imaging and Spectroscopy (RRID:SCR_019924) instrument resource Microscope imaging filter that is optimized for cryo-EM and cryo-ET to gain further insight into system function and disease progression at the molecular level. Gatan, TEM Imgaging and Spectroscopy, imaging Filter, Instrument Equipment, USEDit, Commercially available Model_Number_BioContinuum SCR_019924 2026-09-19 12:54:21 2
Faxitron: LX-60 X-Ray Machine
 
Resource Report
Resource Website
Faxitron: LX-60 X-Ray Machine (RRID:SCR_019884) instrument resource LX-60 Specimen Radiography System is best for imaging larger animals and more dense specimens, due to its cabinet size and energy range of up to 60 kV. The system's large 12 cm x 12 cm camera offers 10 lp/mm spatial resolution. Magnification allows for spatial resolution of up to 60 lp/mm. The 10-12 �m typical focal spot and up to 6X additional geometric magnification provide ultra high-contrast and high spatial resolution images. If a larger field of view is required, the LX-60 can be used with a CR plate and small, upright CR reader to obtain a field of view up to 10� x 12� (25.4 cm x 30.5 cm). Faxitron, X-Ray Machine, Instrument Equipment, USEDit Commercially available Model_Number_LX-60 SCR_019884 2026-09-19 12:54:20 0
FEI: Hyperion II System
 
Resource Report
Resource Website
FEI: Hyperion II System (RRID:SCR_019885) instrument resource Electrical failure analysis system for semiconductors that offers transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement. FEI, EFA System, Instrument Equipment, USEDit, Commercially available Model_Number_Hyperion_II SCR_019885 2026-09-19 12:54:20 0
FEI: Helios NanoLab 1200AT DualBeam for Semiconductors
 
Resource Report
Resource Website
FEI: Helios NanoLab 1200AT DualBeam for Semiconductors (RRID:SCR_019886) instrument resource Wafer analysis system that can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. FEI, DualBeam Microscope, Instrument Equipment, USEDit, Commercially available https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_019886.pdf Model_Number_NanoLab 1200AT https://www.fei.com/products/dualbeam/helios-nanolab-1200at-for-semiconductors/ SCR_019886 2026-09-19 12:54:20 0
FEI: Krios G4 Cryo-TEM
 
Resource Report
Resource Website
1+ mentions
FEI: Krios G4 Cryo-TEM (RRID:SCR_019887) instrument resource Transmission electron microscope that is used for automated applications such as single particle analysis, cryo-electron tomography, and micro electron diffraction. FEI, TEM, Instrument Equipment, USEDit, Commercially available Model_Number_Krios G4 SCR_019887 2026-09-19 12:54:20 1
Formulatrix: Formulator liquid handler for preparing crystallization reservoirs
 
Resource Report
Resource Website
Formulatrix: Formulator liquid handler for preparing crystallization reservoirs (RRID:SCR_019920) instrument resource Liquid handler specifically designed for Protein Crystallography that uses patented microfluidic technology to dispense up to 34 different ingredients. A 96-nozzle dispensing chip can dispense any volume of any ingredient of any viscosity into any well. Formulatrix, Liquid Handler, Instrument Equipment, USEDit Commercially available Model_Number_Formulator SCR_019920 2026-09-19 12:54:21 0
Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences
 
Resource Report
Resource Website
1+ mentions
Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences (RRID:SCR_019880) instrument resource Sample preparation tool used for the preparation of thin, electron transparent lamellas for high resolution cryo electron tomography or MicroED of micro crystals. FEI, DualBeam Microscope, Instrument Equipment, USEDit, Commercially available Model_Number_Aquilos 2 SCR_019880 2026-09-19 12:54:20 1
FEI: flexProber System for Semiconductors
 
Resource Report
Resource Website
FEI: flexProber System for Semiconductors (RRID:SCR_019881) instrument resource Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis. FEI, EFA System, Instrument Equipment, USEDit, Commercially available Model_Number_flexProber SCR_019881 2026-09-19 12:54:20 0
FEI: Phenom Pure Desktop SEM
 
Resource Report
Resource Website
FEI: Phenom Pure Desktop SEM (RRID:SCR_019899) instrument resource Desktop scanning electron microscope that provides high-quality images and features autofocus and automated source alignments. FEI, SEM, Instrument Equipment, USEDit, Commercially available Model_Number_Phenom Pure SCR_019899 2026-09-19 12:54:21 0
FEI: OptiFIB Taipan for Semiconductors
 
Resource Report
Resource Website
FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) instrument resource Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing. FEI, FIB Microscope, Instrument Equipment, USEDit, Commercially available Model_Number_OptiFIB SCR_019895 2026-09-19 12:54:21 0
FEI: Phenom GSR Desktop SEM
 
Resource Report
Resource Website
FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) instrument resource Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle. FEI, SEM, Instrument Equipment, USEDit, Commercially available Model_Number_Phenom GSR SCR_019896 2026-09-19 12:54:21 0
FEI: Meridian M System for Semiconductors
 
Resource Report
Resource Website
FEI: Meridian M System for Semiconductors (RRID:SCR_019897) instrument resource Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults. FEI, EFA System, Instrument Equipment, USEDit, Commercially available Model_Number_Meridian_M SCR_019897 2026-09-19 12:54:21 0
FEI: ELITE System for Semiconductors
 
Resource Report
Resource Website
FEI: ELITE System for Semiconductors (RRID:SCR_019891) instrument resource Semiconductor with enhanced lock in thermal emission that provides better signal to noise ratio, increased sensitivity and higher feature resolution than steady state thermography. FEI, EFA System, Instrument, Equipment, USEDit, Commercially available Model_Number_ELITE SCR_019891 2026-09-19 12:54:20 0
FEI: Meridian WS-DP System for Semiconductors
 
Resource Report
Resource Website
FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) instrument resource Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards. FEI, EFA System, Instrument Equipment, USEDit, Commercially available Model_Number_Meridian_WS_DP SCR_019890 2026-09-19 12:54:20 0
Eppendorf: epMotion 5075t Automated Pipetting
 
Resource Report
Resource Website
Eppendorf: epMotion 5075t Automated Pipetting (RRID:SCR_019868) instrument resource Automated pipetting workstation that includes a proprietary module to mix, heat or cool samples and reagents. The module can be loaded and unloaded with the gripper and pipetting to the mixer is possible before and after mixing steps. Eppendorf, Automated Pipetting, Instrument, Resource Equipment, Equipment, USEDit, Commercially available Model_Number_epMotion_5075t SCR_019868 2026-09-19 12:54:20 0
FEI: Quattro ESEM
 
Resource Report
Resource Website
FEI: Quattro ESEM (RRID:SCR_019901) instrument resource Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible. FEI, SEM, Instrument Equipment, USEDit, Environmental Scanning Electron Microscope, electron microscope, Commercially available Model_Number_Quattro_ESEM SCR_019901 2026-09-19 12:54:21 0
Eppendorf: epMotion 5075v Automated Pipetting
 
Resource Report
Resource Website
Eppendorf: epMotion 5075v Automated Pipetting (RRID:SCR_019869) instrument resource Automated pipetting workstation that allows walk away automation of purification protocols that rely on vacuum filtration performing applications, such as nucleic acid purification or solid phase extraction away from workbench. Eppendorf, Automated Pipetting, Instrument, Resource Equipment, Equipment, USEDit, Commercially available https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019869.pdf Model_Number_epMotion_5075v SCR_019869 2026-09-19 12:54:20 0

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