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SciCrunch Registry is a curated repository of scientific resources, with a focus on biomedical resources, including tools, databases, and core facilities - visit SciCrunch to register your resource.
| Resource Name | Proper Citation | Abbreviations | Resource Type |
Description |
Keywords | Resource Relationships | |||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Fluidigm: Helios Cell Mass Cytometer Resource Report Resource Website 1+ mentions |
Fluidigm: Helios Cell Mass Cytometer (RRID:SCR_019917) | instrument resource | Helios, a CyTOF system, comprises the most recent advances in mass cytometry and is designed to provide a new and improved tool for bioanalytical single-cell detection and analysis. This high-performance mass cytometer, from the CyTOF family of instruments, enables the analysis of more than 40 markers and ly allows their quantitative determination with negligible spectral overlap, a result of exquisite resolution between mass detection channels. Helios provides users with 135 detection channels that can simultaneously resolve multiple elemental probes at high acquisition rates, thereby maximizing the per-cell information obtained from a single sample. The expanded mass range of 75 209 amu and superior mass resolution provide researchers with the ability to differentiate adjacent peaks. The Helios system provides fast instrument startup, an easyto-use pneumatic sample loading system, an improved cell detection rate, and enhanced data storage capabilities. These attributes provide researchers with an unparalleled ability to generate high-resolution phenotypic and functional profiles of cells from normal and diseased states | Fluidigm, Cell Mass Cytometer, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019917.pdf | Model_Number_Helios | SCR_019917 | 2026-09-19 12:54:21 | 2 | |||||||||
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FEI: Meridian 7 System for Semiconductors Resource Report Resource Website |
FEI: Meridian 7 System for Semiconductors (RRID:SCR_019888) | instrument resource | Electrical failure analysis system for semiconductors that provides visible laser voltage imaging and probing and dynamic laser stimulation on sub-10nm devices. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Meridian_7 | SCR_019888 | 2026-09-19 12:54:20 | 0 | ||||||||||
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Thermo Fisher: Forma Steri-Cycle CO2 Incubators Resource Report Resource Website 1+ mentions |
Thermo Fisher: Forma Steri-Cycle CO2 Incubators (RRID:SCR_019921) | instrument resource | Incubator that features an in-chamber HEPA air filtration system, which provides continuous protection against unwanted airborne contaminants, along with an on-demand, high-temperature sterilization cycle that simplifies routine cleaning. | Thermo Fisher, Thermo Fisher, Incubator, Instrument, Equipment, USEDit, | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019921.pdf | Model_Number_Steri-Cycle | SCR_019921 | 2026-09-19 12:54:21 | 2 | |||||||||
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Gatan: BioContinuum Imaging Filter Transmission Electron Microscope (TEM) Imaging and Spectroscopy Resource Report Resource Website 1+ mentions |
Gatan: BioContinuum Imaging Filter Transmission Electron Microscope (TEM) Imaging and Spectroscopy (RRID:SCR_019924) | instrument resource | Microscope imaging filter that is optimized for cryo-EM and cryo-ET to gain further insight into system function and disease progression at the molecular level. | Gatan, TEM Imgaging and Spectroscopy, imaging Filter, Instrument Equipment, USEDit, | Commercially available | Model_Number_BioContinuum | SCR_019924 | 2026-09-19 12:54:21 | 2 | ||||||||||
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Faxitron: LX-60 X-Ray Machine Resource Report Resource Website |
Faxitron: LX-60 X-Ray Machine (RRID:SCR_019884) | instrument resource | LX-60 Specimen Radiography System is best for imaging larger animals and more dense specimens, due to its cabinet size and energy range of up to 60 kV. The system's large 12 cm x 12 cm camera offers 10 lp/mm spatial resolution. Magnification allows for spatial resolution of up to 60 lp/mm. The 10-12 �m typical focal spot and up to 6X additional geometric magnification provide ultra high-contrast and high spatial resolution images. If a larger field of view is required, the LX-60 can be used with a CR plate and small, upright CR reader to obtain a field of view up to 10� x 12� (25.4 cm x 30.5 cm). | Faxitron, X-Ray Machine, Instrument Equipment, USEDit | Commercially available | Model_Number_LX-60 | SCR_019884 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Hyperion II System Resource Report Resource Website |
FEI: Hyperion II System (RRID:SCR_019885) | instrument resource | Electrical failure analysis system for semiconductors that offers transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Hyperion_II | SCR_019885 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Helios NanoLab 1200AT DualBeam for Semiconductors Resource Report Resource Website |
FEI: Helios NanoLab 1200AT DualBeam for Semiconductors (RRID:SCR_019886) | instrument resource | Wafer analysis system that can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. | FEI, DualBeam Microscope, Instrument Equipment, USEDit, | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_019886.pdf | Model_Number_NanoLab 1200AT | https://www.fei.com/products/dualbeam/helios-nanolab-1200at-for-semiconductors/ | SCR_019886 | 2026-09-19 12:54:20 | 0 | ||||||||
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FEI: Krios G4 Cryo-TEM Resource Report Resource Website 1+ mentions |
FEI: Krios G4 Cryo-TEM (RRID:SCR_019887) | instrument resource | Transmission electron microscope that is used for automated applications such as single particle analysis, cryo-electron tomography, and micro electron diffraction. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Krios G4 | SCR_019887 | 2026-09-19 12:54:20 | 1 | ||||||||||
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Formulatrix: Formulator liquid handler for preparing crystallization reservoirs Resource Report Resource Website |
Formulatrix: Formulator liquid handler for preparing crystallization reservoirs (RRID:SCR_019920) | instrument resource | Liquid handler specifically designed for Protein Crystallography that uses patented microfluidic technology to dispense up to 34 different ingredients. A 96-nozzle dispensing chip can dispense any volume of any ingredient of any viscosity into any well. | Formulatrix, Liquid Handler, Instrument Equipment, USEDit | Commercially available | Model_Number_Formulator | SCR_019920 | 2026-09-19 12:54:21 | 0 | ||||||||||
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Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences Resource Report Resource Website 1+ mentions |
Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences (RRID:SCR_019880) | instrument resource | Sample preparation tool used for the preparation of thin, electron transparent lamellas for high resolution cryo electron tomography or MicroED of micro crystals. | FEI, DualBeam Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_Aquilos 2 | SCR_019880 | 2026-09-19 12:54:20 | 1 | ||||||||||
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FEI: flexProber System for Semiconductors Resource Report Resource Website |
FEI: flexProber System for Semiconductors (RRID:SCR_019881) | instrument resource | Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_flexProber | SCR_019881 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Phenom Pure Desktop SEM Resource Report Resource Website |
FEI: Phenom Pure Desktop SEM (RRID:SCR_019899) | instrument resource | Desktop scanning electron microscope that provides high-quality images and features autofocus and automated source alignments. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Phenom Pure | SCR_019899 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: OptiFIB Taipan for Semiconductors Resource Report Resource Website |
FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) | instrument resource | Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing. | FEI, FIB Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_OptiFIB | SCR_019895 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: Phenom GSR Desktop SEM Resource Report Resource Website |
FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) | instrument resource | Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Phenom GSR | SCR_019896 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: Meridian M System for Semiconductors Resource Report Resource Website |
FEI: Meridian M System for Semiconductors (RRID:SCR_019897) | instrument resource | Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Meridian_M | SCR_019897 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: ELITE System for Semiconductors Resource Report Resource Website |
FEI: ELITE System for Semiconductors (RRID:SCR_019891) | instrument resource | Semiconductor with enhanced lock in thermal emission that provides better signal to noise ratio, increased sensitivity and higher feature resolution than steady state thermography. | FEI, EFA System, Instrument, Equipment, USEDit, | Commercially available | Model_Number_ELITE | SCR_019891 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Meridian WS-DP System for Semiconductors Resource Report Resource Website |
FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) | instrument resource | Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Meridian_WS_DP | SCR_019890 | 2026-09-19 12:54:20 | 0 | ||||||||||
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Eppendorf: epMotion 5075t Automated Pipetting Resource Report Resource Website |
Eppendorf: epMotion 5075t Automated Pipetting (RRID:SCR_019868) | instrument resource | Automated pipetting workstation that includes a proprietary module to mix, heat or cool samples and reagents. The module can be loaded and unloaded with the gripper and pipetting to the mixer is possible before and after mixing steps. | Eppendorf, Automated Pipetting, Instrument, Resource Equipment, Equipment, USEDit, | Commercially available | Model_Number_epMotion_5075t | SCR_019868 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Quattro ESEM Resource Report Resource Website |
FEI: Quattro ESEM (RRID:SCR_019901) | instrument resource | Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible. | FEI, SEM, Instrument Equipment, USEDit, Environmental Scanning Electron Microscope, electron microscope, | Commercially available | Model_Number_Quattro_ESEM | SCR_019901 | 2026-09-19 12:54:21 | 0 | ||||||||||
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Eppendorf: epMotion 5075v Automated Pipetting Resource Report Resource Website |
Eppendorf: epMotion 5075v Automated Pipetting (RRID:SCR_019869) | instrument resource | Automated pipetting workstation that allows walk away automation of purification protocols that rely on vacuum filtration performing applications, such as nucleic acid purification or solid phase extraction away from workbench. | Eppendorf, Automated Pipetting, Instrument, Resource Equipment, Equipment, USEDit, | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019869.pdf | Model_Number_epMotion_5075v | SCR_019869 | 2026-09-19 12:54:20 | 0 |
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