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| Resource Name | Proper Citation | Abbreviations | Resource Type |
Description |
Keywords | Resource Relationships | |||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Formulatrix: Formulator liquid handler for preparing crystallization reservoirs Resource Report Resource Website |
Formulatrix: Formulator liquid handler for preparing crystallization reservoirs (RRID:SCR_019920) | instrument resource | Liquid handler specifically designed for Protein Crystallography that uses patented microfluidic technology to dispense up to 34 different ingredients. A 96-nozzle dispensing chip can dispense any volume of any ingredient of any viscosity into any well. | Formulatrix, Liquid Handler, Instrument Equipment, USEDit | Commercially available | Model_Number_Formulator | SCR_019920 | 2026-09-19 12:54:21 | 0 | ||||||||||
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Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences Resource Report Resource Website 1+ mentions |
Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences (RRID:SCR_019880) | instrument resource | Sample preparation tool used for the preparation of thin, electron transparent lamellas for high resolution cryo electron tomography or MicroED of micro crystals. | FEI, DualBeam Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_Aquilos 2 | SCR_019880 | 2026-09-19 12:54:20 | 1 | ||||||||||
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FEI: flexProber System for Semiconductors Resource Report Resource Website |
FEI: flexProber System for Semiconductors (RRID:SCR_019881) | instrument resource | Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_flexProber | SCR_019881 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Phenom Pure Desktop SEM Resource Report Resource Website |
FEI: Phenom Pure Desktop SEM (RRID:SCR_019899) | instrument resource | Desktop scanning electron microscope that provides high-quality images and features autofocus and automated source alignments. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Phenom Pure | SCR_019899 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: OptiFIB Taipan for Semiconductors Resource Report Resource Website |
FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) | instrument resource | Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing. | FEI, FIB Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_OptiFIB | SCR_019895 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: Phenom GSR Desktop SEM Resource Report Resource Website |
FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) | instrument resource | Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Phenom GSR | SCR_019896 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: Meridian M System for Semiconductors Resource Report Resource Website |
FEI: Meridian M System for Semiconductors (RRID:SCR_019897) | instrument resource | Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Meridian_M | SCR_019897 | 2026-09-19 12:54:21 | 0 | ||||||||||
|
FEI: ELITE System for Semiconductors Resource Report Resource Website |
FEI: ELITE System for Semiconductors (RRID:SCR_019891) | instrument resource | Semiconductor with enhanced lock in thermal emission that provides better signal to noise ratio, increased sensitivity and higher feature resolution than steady state thermography. | FEI, EFA System, Instrument, Equipment, USEDit, | Commercially available | Model_Number_ELITE | SCR_019891 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Meridian WS-DP System for Semiconductors Resource Report Resource Website |
FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) | instrument resource | Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Meridian_WS_DP | SCR_019890 | 2026-09-19 12:54:20 | 0 | ||||||||||
|
Eppendorf: epMotion 5075t Automated Pipetting Resource Report Resource Website |
Eppendorf: epMotion 5075t Automated Pipetting (RRID:SCR_019868) | instrument resource | Automated pipetting workstation that includes a proprietary module to mix, heat or cool samples and reagents. The module can be loaded and unloaded with the gripper and pipetting to the mixer is possible before and after mixing steps. | Eppendorf, Automated Pipetting, Instrument, Resource Equipment, Equipment, USEDit, | Commercially available | Model_Number_epMotion_5075t | SCR_019868 | 2026-09-19 12:54:20 | 0 | ||||||||||
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FEI: Quattro ESEM Resource Report Resource Website |
FEI: Quattro ESEM (RRID:SCR_019901) | instrument resource | Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible. | FEI, SEM, Instrument Equipment, USEDit, Environmental Scanning Electron Microscope, electron microscope, | Commercially available | Model_Number_Quattro_ESEM | SCR_019901 | 2026-09-19 12:54:21 | 0 | ||||||||||
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Eppendorf: epMotion 5075v Automated Pipetting Resource Report Resource Website |
Eppendorf: epMotion 5075v Automated Pipetting (RRID:SCR_019869) | instrument resource | Automated pipetting workstation that allows walk away automation of purification protocols that rely on vacuum filtration performing applications, such as nucleic acid purification or solid phase extraction away from workbench. | Eppendorf, Automated Pipetting, Instrument, Resource Equipment, Equipment, USEDit, | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019869.pdf | Model_Number_epMotion_5075v | SCR_019869 | 2026-09-19 12:54:20 | 0 | |||||||||
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Eppendorf: 5804R Centrifuge Resource Report Resource Website |
Eppendorf: 5804R Centrifuge (RRID:SCR_019860) | instrument resource | Centrifuge for medium capacity needs that allows for molecular applications in tubes up to 250 mL and offers additional swing bucket and fixed angle rotors as well as deepwell plate capacity for versatility. It has a centrifugation speed of up to14,000 rpm. | Eppendorf, Centrifuge, Instrument, Equipment, USEDit, | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019860.pdf | Model_Number_5804R | SCR_019860 | 2026-09-19 12:54:20 | 0 | |||||||||
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FEI: Talos F200X G2 TEM and STEM Resource Report Resource Website 1+ mentions |
FEI: Talos F200X G2 TEM and STEM (RRID:SCR_019907) | instrument resource | Transmission electron microscope that combines high-resolution STEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_F200X | SCR_019907 | 2026-09-19 12:54:21 | 1 | ||||||||||
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FEI: Themis S S/TEM for Semiconductors Resource Report Resource Website |
FEI: Themis S S/TEM for Semiconductors (RRID:SCR_019909) | instrument resource | Scanning/transmission electron microscope that is designed for high-speed imaging and analysis of semiconductor devices. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Themis S | SCR_019909 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: Talos F200C TEM and STEM (Scanning/Transmission Electron Microscope) Resource Report Resource Website 1+ mentions |
FEI: Talos F200C TEM and STEM (Scanning/Transmission Electron Microscope) (RRID:SCR_019903) | instrument resource | Microscope that is designed for performance and productivity across a wide range of samples and applications, such as 2D and 3D imaging of cells, organelles, asbestos, polymers, and soft materials, both at ambient and cryogenic temperatures. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_F200C | SCR_019903 | 2026-09-19 12:54:21 | 1 | ||||||||||
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FEI: Prisma E SEM Resource Report Resource Website |
FEI: Prisma E SEM (RRID:SCR_019904) | instrument resource | Scanning electron microscope that is used for industrial research and development with environmental SEM capability. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Prisma E | SCR_019904 | 2026-09-19 12:54:21 | 0 | ||||||||||
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FEI: Talos Arctica Cryo-TEM Resource Report Resource Website 1+ mentions |
FEI: Talos Arctica Cryo-TEM (RRID:SCR_019905) | instrument resource | Transmission electron microscope that is built for delivering high-resolution 3D characterization of biological samples and biomaterials in cell biology, structural biology, and nanotechnology research. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Talos Arctica | SCR_019905 | 2026-09-19 12:54:21 | 1 | ||||||||||
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FEI: Talos F200S G2 TEM and STEM Resource Report Resource Website 1+ mentions |
FEI: Talos F200S G2 TEM and STEM (RRID:SCR_019906) | instrument resource | TEM and STEM microscope for dynamic microscopy. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_F200S | SCR_019906 | 2026-09-19 12:54:21 | 1 | ||||||||||
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Excella: NB24 Shaking Incubator Resource Report Resource Website |
Excella: NB24 Shaking Incubator (RRID:SCR_019877) | instrument resource | Biological shaker with heavy-duty drives that provide long life and quiet operation under moderate loads and at speeds up to 400 rpm. | Excella, Shaking Incubator, Instrument, Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019877.pdf | Model_Number_NB24 | SCR_019877 | 2026-09-19 12:54:20 | 0 |
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