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https://mobile.labwrench.com/equipment/13524/molecular-devices/flexstation-ii

Molecular Devices FlexStation II is a benchtop scanning fluorometer and integrated fluid transfer workstation capable of conducting endpoint, kinetic, lambda scan and well scan experiments in a multi-well plate format (6, 12, 24, 48 and 96-well) and fluidics transfer experiments in 96-well format. The FlexStation II is best for measuring the activity of Gq-coupled receptors via the detection of intracellular calcium release. In addition, kits are available for the measurement of fatty acid uptake, cyclic GMP and AMP levels, potassium ion channel flux, and membrane potential. The dual monochromator optical bench design allows the user to choose multiple wavelengths and to optimize excitation and emission wavelengths for most fluorometric assays. Allow the user to obtain real-time kinetic data milliseconds before and after fluid transfer events. The dual monochromator optical bench design enables the user to choose multiple wavelengths and to optimize both excitation and emission wavelengths for most fluorometric assays.

Proper citation: Molecular Devices: Flexstation II Dual Monochromator Fluorescence Kinetics Flexstation (RRID:SCR_019919) Copy   

•   Source: SciCrunch Registry

https://www.fishersci.com/shop/products/femtojet-4x-microinjector/E5253000025

THIS RESOURCE IS NO LONGER IN SERVICE. Documented on November 14, 2023. Eppendorf electronic microinjectors FemtoJet 4i and FemtoJet 4x with their operation menu and a range of functionalities are perfectly suited for injecting small to intermediate volumes. With a built-in compressor, the FemtoJet 4i is the tool of choice for injecting aqueous solutions into adherent cells and suspension cells. If your research demands injecting volumes greater than 100 pL and/or longer series at higher pressures, FemtoJet 4x with its external pressure supply (not included) delivers the precise and continuous pressure required. Featuring the same quality design and compatibility features as the FemtoJet 4i, the FemtoJet 4x is the "heavy duty" device for those more demanding applications. Both the FemtoJet 4i and FemtoJet 4x, form the system with Eppendorf micromanipulators, yet they integrate just as easily with non-Eppendorf micromanipulation systems. The electronic connection between FemtoJet 4i or 4x and TransferMan 4r or InjectMan 4 guarantees simple, rapid and reproducible microinjections into cells, simplifying your daily work and speeding up your workflow. The FemtoJet 4i/ 4x injectors are for research use only.

Proper citation: Eppendorf: FemtoJet 4x electronic microinjector (RRID:SCR_019915) Copy   

•   Source: SciCrunch Registry

https://www.fluidigm.com/binaries/content/documents/fluidigm/resources/helios-user-guide0400250/helios-user-guide0400250/fluidigm%3Afile

Helios, a CyTOF system, comprises the most recent advances in mass cytometry and is designed to provide a new and improved tool for bioanalytical single-cell detection and analysis. This high-performance mass cytometer, from the CyTOF family of instruments, enables the analysis of more than 40 markers and ly allows their quantitative determination with negligible spectral overlap, a result of exquisite resolution between mass detection channels. Helios provides users with 135 detection channels that can simultaneously resolve multiple elemental probes at high acquisition rates, thereby maximizing the per-cell information obtained from a single sample. The expanded mass range of 75 209 amu and superior mass resolution provide researchers with the ability to differentiate adjacent peaks. The Helios system provides fast instrument startup, an easyto-use pneumatic sample loading system, an improved cell detection rate, and enhanced data storage capabilities. These attributes provide researchers with an unparalleled ability to generate high-resolution phenotypic and functional profiles of cells from normal and diseased states

Proper citation: Fluidigm: Helios Cell Mass Cytometer (RRID:SCR_019917) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/Meridian-7-for-Semiconductors/

Electrical failure analysis system for semiconductors that provides visible laser voltage imaging and probing and dynamic laser stimulation on sub-10nm devices.

Proper citation: FEI: Meridian 7 System for Semiconductors (RRID:SCR_019888) Copy   

•   Source: SciCrunch Registry

https://www.gatan.com/products/tem-imaging-spectroscopy/biocontinuum-imaging-filter

Microscope imaging filter that is optimized for cryo-EM and cryo-ET to gain further insight into system function and disease progression at the molecular level.

Proper citation: Gatan: BioContinuum Imaging Filter Transmission Electron Microscope (TEM) Imaging and Spectroscopy (RRID:SCR_019924) Copy   

•   Source: SciCrunch Registry

https://www.labtech.com.mx/files/LX60-cabinet.pdf

LX-60 Specimen Radiography System is best for imaging larger animals and more dense specimens, due to its cabinet size and energy range of up to 60 kV. The system's large 12 cm x 12 cm camera offers 10 lp/mm spatial resolution. Magnification allows for spatial resolution of up to 60 lp/mm. The 10-12 �m typical focal spot and up to 6X additional geometric magnification provide ultra high-contrast and high spatial resolution images. If a larger field of view is required, the LX-60 can be used with a CR plate and small, upright CR reader to obtain a field of view up to 10� x 12� (25.4 cm x 30.5 cm).

Proper citation: Faxitron: LX-60 X-Ray Machine (RRID:SCR_019884) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/hyperion-II-for-semiconductors/

Electrical failure analysis system for semiconductors that offers transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement.

Proper citation: FEI: Hyperion II System (RRID:SCR_019885) Copy   

•   Source: SciCrunch Registry

https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_019886.pdf

Wafer analysis system that can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter.

Proper citation: FEI: Helios NanoLab 1200AT DualBeam for Semiconductors (RRID:SCR_019886) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/krios-g3i-cryo-tem-for-life-sciences/

Transmission electron microscope that is used for automated applications such as single particle analysis, cryo-electron tomography, and micro electron diffraction.

Proper citation: FEI: Krios G4 Cryo-TEM (RRID:SCR_019887) Copy   

•   Source: SciCrunch Registry

https://formulatrix.com/protein-crystallization-systems/formulator-protein-crystallography-screen-builder/

Liquid handler specifically designed for Protein Crystallography that uses patented microfluidic technology to dispense up to 34 different ingredients. A 96-nozzle dispensing chip can dispense any volume of any ingredient of any viscosity into any well.

Proper citation: Formulatrix: Formulator liquid handler for preparing crystallization reservoirs (RRID:SCR_019920) Copy   

•   Source: SciCrunch Registry

https://www.thermofisher.com/us/en/home/electron-microscopy/products/dualbeam-fib-sem-microscopes/aquilos-2-cryo-fib.html

Sample preparation tool used for the preparation of thin, electron transparent lamellas for high resolution cryo electron tomography or MicroED of micro crystals.

Proper citation: Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences (RRID:SCR_019880) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/flexprober-for-semiconductors/

Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis.

Proper citation: FEI: flexProber System for Semiconductors (RRID:SCR_019881) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/phenom-pure/

Desktop scanning electron microscope that provides high-quality images and features autofocus and automated source alignments.

Proper citation: FEI: Phenom Pure Desktop SEM (RRID:SCR_019899) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/fib/optifib-taipan-for-semiconductors/

Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing.

Proper citation: FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/phenom-gsr/

Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle.

Proper citation: FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/meridian-m-for-semiconductors/

Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults.

Proper citation: FEI: Meridian M System for Semiconductors (RRID:SCR_019897) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/meridian-ws-dp-for-semiconductors/

Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards.

Proper citation: FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/quattro-for-materials-science/

Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible.

Proper citation: FEI: Quattro ESEM (RRID:SCR_019901) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/talos-f200x-for-materials-science/

Transmission electron microscope that combines high-resolution STEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection.

Proper citation: FEI: Talos F200X G2 TEM and STEM (RRID:SCR_019907) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/themis-s-for-semiconductors/

Scanning/transmission electron microscope that is designed for high-speed imaging and analysis of semiconductor devices.

Proper citation: FEI: Themis S S/TEM for Semiconductors (RRID:SCR_019909) Copy   

•   Source: SciCrunch Registry