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URL: https://www.fei.com/products/efa/meridian-ws-dp-for-semiconductors/
Proper Citation: FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890)
Description: Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards.
Resource Type: instrument resource
Keywords: FEI, EFA System, Instrument Equipment, USEDit,
Availability: Commercially available
Resource Name: FEI: Meridian WS-DP System for Semiconductors
Resource ID: SCR_019890
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400
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