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URL: https://www.yxlon.com/en/products/x-ray-and-ct-inspection-systems/yxlon-ff70-cl
Proper Citation: YXLON: FF70 CL X-Ray System (RRID:SCR_020908)
Description: X ray inspection system has been developed to enable automated analysis for flaws in semi-conductors. Flaws can be found on wafer, on substrate, in strip in sub assembly or in final device.
Resource Type: instrument resource
Keywords: YXLON, X-Ray System, Instrument Equipment, USEDit,
Availability: Commercially available
Resource Name: YXLON: FF70 CL X-Ray System
Resource ID: SCR_020908
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400