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JEOL: JSM-F100 Field Emission Scanning Electron Microscope (SEM) (RRID:SCR_020187)Copy Citation Copied
URL: https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/FE-SEM/JSM-F100
Proper Citation: JEOL: JSM-F100 Field Emission Scanning Electron Microscope (SEM) (RRID:SCR_020187)
Description: Scanning electron microscope that offers high spatial resolution imaging and analysis at nanoscale
Resource Type: instrument resource
Keywords: Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit,
Availability: Commercially available
Resource Name: JEOL: JSM-F100 Field Emission Scanning Electron Microscope (SEM)
Resource ID: SCR_020187
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400