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URL: https://www.fei.com/products/dualbeam/exsolve/
Proper Citation: FEI: ExSolve Wafer TEM Prep DualBeam (RRID:SCR_019882)
Description: Sample preparation workflow that is used for transmission electron microscopy (TEM) analysis.
Resource Type: instrument resource
Keywords: FEI, sample preparation system, Instrument, Equipment, USEDit,
Availability: Commercially available
Resource Name: FEI: ExSolve Wafer TEM Prep DualBeam
Resource ID: SCR_019882
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400
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